RESIST: reliability aware system design

Electronic systems in mobiles and cars are becoming more sophisticated, and demand more integration and higher performance from semiconductors. However, it is well-recognized that technology scaling alone threatens the integration of highly reliable and safety critical products in scaled technologies due to the associated product lifetime degradation. In the RESIST project we want to develop a methodology which will help the designer to identify how the system can adapt to the changing environment. The idea is to develop a system level simulation environment which models a typical SoC (processor, memory, IO blocks) and based upon aging models find contra-measures to fight-off timing delay, temperature or otherwise degrading parameters.

Contact

dr.ir. René van Leuken

Signal Processing Systems Group

Department of Microelectronics

Last modified: 2018-07-12